Kate Stokes is a Product Scientist at Oxford Instruments, specialising in the application of advanced characterisation techniques within the semiconductor industry. Her expertise spans electron, ion beam, scanning probe and optical characterisation methods, including SEM, FIB, EDS, EBSD, AFM, Raman spectroscopy and photoluminescence. She holds a degree in Physics (MPhys) from the University of Warwick and an Engineering Doctorate (EngD) from the University of Birmingham.